This is a standard model equipped with a spectrometer suitable for coating thickness measurement in a compact housing with an integrated light source. Non-contact measurement is possible without disturbing the surface of the workpiece after coating.
A wide range of measurement wavelengths and measurable film thicknesses are covered.
Measurement of possible film thickness
Principle of Reflectance Spectrophotometer Measurement
When light shines on a transparent film, the light reflected on the film surface (R1) and the light refracted inside the film and reflected on the substrate surface (R2) overlap and the light is intensified or weakened.
This is called "interference of light". When the phases of the light match, the intensity increases; when they are out of phase, the intensity weakens.
The figure on the right is an image of "light interference. Reflectance spectrometer" is a method of measuring film thickness by analyzing the interference (wavelength) of light and converting it into a film thickness value.
Calculate the theory
Find the film thickness value at which the square of the difference between the measured and theoretical reflectance is the smallest.
Recommended for use when there are less than 3 waveforms (about 1 μm film thickness).
FFT（Fast Fourier Transform）
The number of interference waveforms indicating film thickness in a certain wavelength width is determined by FFT calculation, from which the wavelength width of one cycle is derived.
Recommended for use when there are 3 or more waveforms (about 1 µm film thickness).
|For general film thickness
|Main body、Stand、Duplex Fiber（1.5m）、PC、Film Thickness Measurement Sample
|Measurement wavelength range
|Film thickness measurement range
|0.2％～1%（Dependent on membrane quality）
|Measuring spot diameter
|Theory of measurement
|C/F / FFT
|External Dimensions of Main body
|W230 × D230 × H135（mm）
|External Dimensions of Stand
|W150 × D150 × H115（mm）
|5.5kg ※Excluding PC
|Power supply used